Oluseyi, Hakeem

Associate Professor
Physics and Space Sciences

Personal Overview

As a professor of Physics & Space Sciences, I see my professional mission as:  1) advancing humanity's understanding of the universe through scientific inquiry; 2) passing on the detailed knowledge of this process and its results to the next generation; and 3) service to humanity and country.

Educational Background

Ph.D. Physics, Stanford University
M.S. Physics, Stanford University
B.S. Physics, Tougaloo College
B.S. Mathematics, Tougaloo College

Recognition & Awards

MLK Professor of Physics, MIT 2014

U.S. State Department Speaker & Specialist to Algeria, 2013

Visiting Scholar, Dept. of Physics, MIT 2013

TED Global Fellow, 2012

Visiting Scholar, Dept. of Astronomy, UC Berkeley 2012, 2013

U.S. State Department Speaker & Specialist to South Africa, 2011, 2012

Special Merit Award for Space Spinoffs radio series, CASE III Advancement Awards, 2011

Outstanding Technical Innovation Award, NSBE ASC 2010

Best Space Sciences Paper, NSBE ASC 2010

NASA Earth-Sun Science New Investigator Fellow, 2006

National Technical Association Technical Achiever of the Year in Physics, 2006

Gordon & Betty Moore Astrophysics Research Fellow, 2003

NSBP Distinguished Dissertation Award, 2002

Ernest O. Lawrence Fellow at LBNL, 2001 – 2004

NASA GSRP Fellow at Stanford University, 1993 – 1999

Current Courses

Solid State Physics
The Whole Earth Course
Physics 1: Newtonian Dynamics

Professional Experience

Associate Professor, Department of Physics & Space Sciences
Florida Institute of Technology (2007 – present)


Assistant Professor, Department of Physics
University of Alabama in Huntsville (2004 – 2007)


E. O. Lawrence Postdoctoral Fellow
Lawrence Berkeley Laboratory (2001 – 2004)


Member of the Technical Staff
Applied Materials, Inc. (1999 – 2001)

Additional Duties

Faculty Advisor, African Students Association
Advisor, Interdisciplinary Sciences Major

Current Research

NEAR-FIELD COSMOLOGY
Galactic Structure and Evolution
Astrostatistics
Time-Domain Informatics
High-Performance Scientific Computing 

SOLAR ATMOSPHERE
Small-scale solar coronal transient phenomena
Field-particle interactions
Multithermal atmospheric structure

TECHNOLOGY DEVELOPMENT
Plasma-based in-space ion propulsion
Solid-State Detectors
Semiconductor Manufacturing

COLLABORATIONS AND SURVEYS
LSST Transients & Variables Collaboration
KELT Exoplanet Candidate Followup
Hands-On Universe

Selected Publications

RECENT PUBLICATIONS

Fendall, M.; Denkins, P.; Fisher, S.; Oluseyi, H. M.; Yarborough, P. "Human Mars Exploration Research Objectives," Proceedings of the 2014 NSBE Aerospace Conference (2014).

Chesny, D.; Oluseyi, H.M.; Orange, N.B. "Non-Potential Fields in the Quiet-Sun Network: EUV and Magnetic Footpoint Observations," Astrophysical Journal Letters, Vol. 778, pp. 17-23 (2013).

Orange, N.B.; Chesny, D.; Oluseyi, H.M.; Hesterly, K.; Patel, M.; Champey, P. "Direct Observations of Plasma Upflows, Condensation, and Catastrophic Cooling in a Solar Transition Region Loop," Astrophysical Journal, Vol. 778, pp. 90-99 (2013).

Orange, N. B.; Oluseyi, H. M.; Chesny, D. L.; Patel, M.; Champey, P.; Hesterly, K.; Anthony, D.; Treen, R. Temporal Variations of the Solar Dynamics Observatorys HMI and AIA Instruments’ Nominal Pointings on Sub-Weekly Time Scales. Solar Physics, DOI: 10.1007/s11207-013-0441-2 (2013).

Orange, N.B.; Oluseyi, H.M.; Chesny, D.L.; Patel, M.; Hesterly, K.; Preuss, L.; Neira, C.; Turner, N. E., "Comparative Analysis of a Transition Region Bright Point with a Blinker and Coronal Bright Point using Multiple EIS Emission Lines," Solar Physics, DOI: 10.1007/s11207-013-0423-4 (2013).

Palaversa, L.; Ivezic, Z; Ruzdjak, D.; Sudar, D.; Galin, M.; Kroflin, A.; Mesaric, M.; Munk, P.; Vrbanec, D.; Bozic, H.; Loebman, S.; Sesar, B.; Rimoldini, L.; Hunt-Walker, N.; VanderPlas, J.; Westman, D.; Stuart, J.S.; Becker, A.C.; Srdoc, G.; Wozniak, P.; Oluseyi, H.M., "Exploring the Variable Sky with LINEAR. III. Classification of Periodic Light Curves," Astronomical Journal, Vol. 146, pp. 101-131 (2013).

Sesar, B.; Ivezic, Z; H.M.; Stuart, J.S.; Morgan, D.M.; Becker, A.C.; Sharma, S.; Palaversa, L.; Juric, M.; Wozniak, P.; Oluseyi, H.M., "Exploring the Variably Sky with LINEAR.II.Halo Structure and Substrucre Traced by RR Lyrae Stars to 30 kpc," As- tronomical Journal, Vol. 146, pp. 21-38 (2013).

Oluseyi, H.M.; Becker, A.; Culliton, C. S.; Furqan, M.; Hoadley, K.; Regencia, P.;Wells, A. J.; Ivezi'c, Z ̆; Jones, R. L.; Krughoff, K. S.; Sesar, B.; Jacoby, J.; Allison, I. J., "Simulated LSST survey of RR Lyrae stars throughout the Local Group," Astronomical Journal, Vol. 144, pp. 9-17 (2012).

Holbrook, J.C.; Oluseyi, H.M.; Williams, A., "Total Solar Eclipse Coverage in Africa: Boundary Maintenance and the Control of Image within the African American Scientific Community," Critical Arts, Vol. 26, Issue 5, pp. 762-787 (2012).

 

US PATENTS

Oluseyi, H.M. 2005. System, Method and Medium for Modeling, Monitoring and/or Controlling Plasma Based Semiconductor Manufacturing Processes. U.S. Patent #6943503, 28 claims.

Shen, M.; Du, Y.; Gani, N.; Yauw, O.; Oluseyi, H.M. 2005. High Selectivity and Residue Free Process for Metal on Thin Dielectric Gate Etch Application. U.S. Patent #6933243, 24 claims.

Oluseyi, H.M. and Sarfaty, M. 2003. Monitoring of Film Characteristics during Plasma- Based Semiconductor Processing Using Optical Emission Spectroscopy. U.S. Patent #6633391, 20 claims.

Oluseyi, H.M. and Sarfaty, M. 2003. Method and Apparatus Employing Optical Emis- sion Spectroscopy to Detect a Fault in Process Conditions of a Semiconductor System. U.S. Patent #6603538, 21 claims.

Nallan, P. and Oluseyi, H.M. 2003. Method of Etching Tungsten or Tungsten Nitride in Semiconductor Structures. U.S. Patent #6579806, 18 claims.

Nallan, P. and Oluseyi, H.M. 2002. Method of Etching Tungsten or Tungsten Nitride Electrode Gates in Semiconductor Structures. U.S. Patent #6440870, 61 claims.

Nallan, P. and Oluseyi, H.M. 2002. Method of Etching Tungsten or Tungsten Nitride Electrode Gates in Semiconductor Structures. U.S. Patent #6423644, 44 claims.

Oluseyi, H.M. and Nallan, P. 2002. Method of Increasing Selectivity to Mask When Etching Tungsten or Tungsten Nitride. U.S. Application #20030235995, 10 claims.

 

EU PATENTS

Oluseyi, H.M. and Sarfaty, M. 2003. Monitoring of Film Characteristics during Plasma- Based Semiconductor Processing Using Optical Emission Spectroscopy. European Application #048227, 20 claims.

Oluseyi, H.M. and Sarfaty, M. 2003. Method and Apparatus Employing Optical Emission Spectroscopy to Detect a Fault in Process Conditions of a Semiconductor System. European Application #043658, 21 claims.

Nallan, P. and Oluseyi, H.M. 2002. Method of Etching Tungsten or Tungsten Nitride Electrode Gates in Semiconductor Structures. European Patent #1350265, 61 claims.

Nallan, P. and Oluseyi, H.M. 2002. Method of Etching Tungsten or Tungsten Nitride Electrode Gates in Semiconductor Structures. European Patent #1299904, 44 claims.