Oluseyi, Hakeem

Associate Professor
Physics and Space Sciences

Personal Overview

As a professor of Physics & Space Sciences, I see my professional mission as:  1) advancing humanity's understanding of the universe through scientific inquiry; 2) passing on the detailed knowledge of this process and its results to the next generation; and 3) service to humanity and country.

Educational Background

Ph.D. Physics, Stanford University
M.S. Physics, Stanford University
B.S. Physics, Tougaloo College
B.S. Mathematics, Tougaloo College

Recognition & Awards

U.S. State Department Speaker & Specialist to Algeria, 2013

Visiting Scholar, Dept. of Physics, MIT 2013

TED Global Fellow, 2012

Visiting Scholar, Dept. of Astronomy, UC Berkeley 2012

U.S. State Department Speaker & Specialist to South Africa, 2011/2012

Outstanding Technical Innovation Award, NSBE ASC 2010

Best Space Sciences Paper, NSBE ASC 2010

NASA Earth-Sun Science New Investigator Fellow, 2006

NTA's Technical Achiever of the Year in Physics, 2006

Gordon & Betty Moore Astrophysics Research Fellow, 2003

NSBP Distinguished Dissertation Award, 2002

Ernest O. Lawrence Fellow at LBNL, 2001 – 2004

NASA GSRP Fellow at Stanford University, 1993 – 1999

Current Courses

Solid State Physics
The Whole Earth Course
Physics Senior Seminar
Space Sciences Senior Seminar
Physics 2: Intro to Electricity & Magnetism 

Professional Experience

Associate Professor, Department of Physics & Space Sciences
Florida Institute of Technology (2007 – present)


Assistant Professor, Department of Physics
University of Alabama in Huntsville (2004 – 2007)


E. O. Lawrence Postdoctoral Fellow
Lawrence Berkeley Laboratory (2001 – 2004)


Member of the Technical Staff
Applied Materials, Inc. (1999 – 2001)

Additional Duties

Faculty Advisor, African Students Association
Advisor, Interdisciplinary Sciences Major

Current Research

NEAR-FIELD COSMOLOGY
Galactic Structure and Evolution
Astrostatistics
Time-Domain Informatics
High-Performance Scientific Computing 

SOLAR ATMOSPHERE
Small-scale solar coronal transient phenomena
Field-particle interactions
Multithermal atmospheric structure

TECHNOLOGY DEVELOPMENT
Plasma-based in-space propulsion
Solid-State Detectors
Semiconductor Manufacturing

COLLABORATIONS AND SURVEYS
LSST Transients & Variables Collaboration
KELT Exoplanet Candidate Followup
Hands-On Universe

Selected Publications

RECENT REFEREED JOURNAL PAPERS

Chesny, D; Oluseyi, H.M.; Orange, N.B. "Non-Potential Fields in the Quiet-Sun Network: EUV and Magnetic Footpoint Observations," Astrophysical Journal Letters, Vol. 778, pp. 17-23 (2013).

Orange, N.B.; Chesny, D.; Oluseyi, H.M.; Hesterly, K.; Patel, M.; Champey, P. "Direct Observations of Plasma Upflows, Condensation, and Catastrophic Cooling in a Solar Transition Region Loop," Astrophysical Journal, Vol. 778, pp. 90-99 (2013).

Orange, N. B.; Oluseyi, H. M.; Chesny, D. L.; Patel, M.; Champey, P.; Hesterly, K.; Anthony, D.; Treen, R. Temporal Variations of the Solar Dynamics Observatorys HMI and AIA Instruments’ Nominal Pointings on Sub-Weekly Time Scales. Solar Physics, DOI: 10.1007/s11207-013-0441-2 (2013).

Orange, N.B.; Oluseyi, H.M.; Chesny, D.L.; Patel, M.; Hesterly, K.; Preuss, L.; Neira, C.; Turner, N. E., "Comparative Analysis of a Transition Region Bright Point with a Blinker and Coronal Bright Point using Multiple EIS Emission Lines," Solar Physics, DOI: 10.1007/s11207-013-0423-4 (2013).

Palaversa, L.; Ivezic, Z; Ruzdjak, D.; Sudar, D.; Galin, M.; Kroflin, A.; Mesaric, M.; Munk, P.; Vrbanec, D.; Bozic, H.; Loebman, S.; Sesar, B.; Rimoldini, L.; Hunt-Walker, N.; VanderPlas, J.; Westman, D.; Stuart, J.S.; Becker, A.C.; Srdoc, G.; Wozniak, P.; Oluseyi, H.M., "Exploring the Variable Sky with LINEAR. III. Classification of Periodic Light Curves," Astronomical Journal, Vol. 146, pp. 101-131 (2013).

Sesar, B.; Ivezic, Z; H.M.; Stuart, J.S.; Morgan, D.M.; Becker, A.C.; Sharma, S.; Palaversa, L.; Juric, M.; Wozniak, P.; Oluseyi, H.M., "Exploring the Variably Sky with LINEAR.II.Halo Structure and Substrucre Traced by RR Lyrae Stars to 30 kpc," As- tronomical Journal, Vol. 146, pp. 21-38 (2013).

Oluseyi, H.M.; Becker, A.; Culliton, C. S.; Furqan, M.; Hoadley, K.; Regencia, P.;Wells, A. J.; Ivezi'c, Z ̆; Jones, R. L.; Krughoff, K. S.; Sesar, B.; Jacoby, J.; Allison, I. J., "Simulated LSST survey of RR Lyrae stars throughout the Local Group," Astronomical Journal, Vol. 144, pp. 9-17 (2012).

Holbrook, J.C.; Oluseyi, H.M.; Williams, A., "Total Solar Eclipse Coverage in Africa: Boundary Maintenance and the Control of Image within the African American Scientific Community," Critical Arts, Vol. 26, Issue 5, pp. 762-787 (2012).

 

US PATENTS

Oluseyi, H.M. 2005. System, Method and Medium for Modeling, Monitoring and/or Controlling Plasma Based Semiconductor Manufacturing Processes. U.S. Patent #6943503, 28 claims.

Shen, M.; Du, Y.; Gani, N.; Yauw, O.; Oluseyi, H.M. 2005. High Selectivity and Residue Free Process for Metal on Thin Dielectric Gate Etch Application. U.S. Patent #6933243, 24 claims.

Oluseyi, H.M. and Sarfaty, M. 2003. Monitoring of Film Characteristics during Plasma- Based Semiconductor Processing Using Optical Emission Spectroscopy. U.S. Patent #6633391, 20 claims.

Oluseyi, H.M. and Sarfaty, M. 2003. Method and Apparatus Employing Optical Emis- sion Spectroscopy to Detect a Fault in Process Conditions of a Semiconductor System. U.S. Patent #6603538, 21 claims.

Nallan, P. and Oluseyi, H.M. 2003. Method of Etching Tungsten or Tungsten Nitride in Semiconductor Structures. U.S. Patent #6579806, 18 claims.

Nallan, P. and Oluseyi, H.M. 2002. Method of Etching Tungsten or Tungsten Nitride Electrode Gates in Semiconductor Structures. U.S. Patent #6440870, 61 claims.

Nallan, P. and Oluseyi, H.M. 2002. Method of Etching Tungsten or Tungsten Nitride Electrode Gates in Semiconductor Structures. U.S. Patent #6423644, 44 claims.

Oluseyi, H.M. and Nallan, P. 2002. Method of Increasing Selectivity to Mask When Etching Tungsten or Tungsten Nitride. U.S. Application #20030235995, 10 claims.

 

EU PATENTS

Oluseyi, H.M. and Sarfaty, M. 2003. Monitoring of Film Characteristics during Plasma- Based Semiconductor Processing Using Optical Emission Spectroscopy. European Application #048227, 20 claims.

Oluseyi, H.M. and Sarfaty, M. 2003. Method and Apparatus Employing Optical Emission Spectroscopy to Detect a Fault in Process Conditions of a Semiconductor System. European Application #043658, 21 claims.

Nallan, P. and Oluseyi, H.M. 2002. Method of Etching Tungsten or Tungsten Nitride Electrode Gates in Semiconductor Structures. European Patent #1350265, 61 claims.

Nallan, P. and Oluseyi, H.M. 2002. Method of Etching Tungsten or Tungsten Nitride Electrode Gates in Semiconductor Structures. European Patent #1299904, 44 claims.